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Reliable Neuromorphic and Nociceptive Behavior in Dual-Stacked IGZO/ZrOX Resistive Random Access Memory for Transparent Memory Applicationsopen access

Jo, Seo-Young; Jang, Heeseong; Mishra, Dhananjay; Kim, Sungjun; Jin, Sung Hun

ArticleIssue Date2025Citationphysica status solidi (RRL) – Rapid Research Letters, v.19, no.10PublisherWiley-VCH GmbH
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