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Quantitative Dynamic Evolution of Unoccupied States in Hydrogen Diffused InGaZnSnO TFT under Positive Bias Temperature Stress

Hong, Hyunmin; Kim, Min Jung; Yi, Dong-Joon; Shin, Dong Yeob; Moon, Yeon-Keon; Son, Kyoung-Seok; Lim, Jun Hyung; Jeong, Kwang Sik; Chung, Kwun-Bum

ArticleIssue Date2024CitationACS Applied Electronic Materials, v.6, no.10, pp 7584 - 7590PublisherAmerican Chemical Society
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