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SCIESCOPUS
Analysis of device performance and thin-film properties of thermally damaged organic light-emitting diodes

Lee, Chang Min; Lee, Won Ho; Jeong, Geon-Woo; Kim, Dong Hyun; Choi, Dong Hyun; Kim, Tae Wook; Islam, Amjad; Jesuraj, P. Justin; Hafeez, Hassan; Chae, Hyung Ju, et al.

ArticleIssue Date2021CitationORGANIC ELECTRONICS, v.99PublisherELSEVIER
SCIESCOPUS
Attaining quantitatively fewer defects in close-packed InGaZnO synthesized using atomic layer deposition

Kim, Yoon-Seo; Hong, Hyunmin; Hong, TaeHyun; Choi, Su-Hwan; Chung, Kwun-Bum; Park, Jin-Seong

ArticleIssue Date2024CitationApplied Surface Science, v.664, pp 1 - 6PublisherElsevier BV
SCIESCOPUS
Band well structure with localized states for enhanced charge accumulation on Triboelectrification

Hwang, Hee Jae; Hong, Hyunmin; Cho, Bong Geun; Lee, Hyeon Kyu; Kim, Jae Sung; Lee, Un Joo; Kim, Wook; Kim, Hakjeong; Chung, Kwun-Bum; Choi, Dukhyun

ArticleIssue Date2021CitationNANO ENERGY, v.90PublisherELSEVIER
SCIESCOPUS
Control of Interfacial Defect States in the Flexible InGaZnO Thin Film Transistor with a 6FDA-MDA Gate Insulator by Using an Al2O3 Interlayer

Kim, Min Jung; Park, Hyunjin; Hong, Hyunmin; Yoo, Sungmi; Jeong, Kwangsik; Kim, Yun Ho; Chung, Kwun-Bum

ArticleIssue Date2024CitationACS Applied Electronic Materials, v.6, no.2, pp 1151 - 1160PublisherAmerican Chemical Society
SCIESCOPUS
Double Gated a-InGaZnO TFT Properties Based on Quantitative Defect Analysis and Computational Modeling

Hong, Hyunmin; Yi, Dong-Joon; Moon, Yeon-Keon; Son, Kyoung-Seok; Lim, Jun Hyung; Jeong, KwangSik; Chung, Kwun-Bum

ArticleIssue Date2024CitationIEEE Transactions on Electron Devices, v.71, no.2, pp 1097 - 1101PublisherIEEE
SCIESCOPUS
Effects of Embedded TiO2-x Nanoparticles on Triboelectric Nanogenerator Performanceopen access

Park, Hyun-Woo; Nghia Dinh Huynh; Kim, Wook; Hwang, Hee Jae; Hong, Hyunmin; Choi, KyuHyeon; Song, Aeran; Chung, Kwun-Bum; Choi, Dukhyun

ArticleIssue Date2018CitationMICROMACHINES, v.9, no.8PublisherMDPI
SCIESCOPUS
Evolution of Defect States within the Band Gap of Indium-Tin-Zinc Oxide Thin Film Transistors Using the Quantitative Defect Analysis Method

Shin, Dong Yeob; Kim, Min Jung; Go, Jinyoung; Hong, Hyunmin; Lee, Sunwoo; Park, Younggil; Weldemhret, Teklebrahan Gebrekrstos; Jeong, Kwangsik; Chung, Kwun-Bum

ArticleIssue Date2025CitationACS Applied Electronic Materials, v.7, no.7, pp 2928 - 2938PublisherAmerican Chemical Society
SCIESCOPUS
Low temperature activation of amorphous In-Ga-Zn-O semiconductors using microwave and e-beam radiation, and the associated thin film transistor propertiesopen access

Jang, Seong Cheol; Park, Jozeph; Kim, Hyoung-Do; Hong, Hyunmin; Chung, Kwun-Bum; Kim, Yong Joo; Kim, Hyun-Suk

ArticleIssue Date2019CitationAIP ADVANCES, v.9, no.2PublisherAIP Publishing
SCIESCOPUS
Noncontact Monitoring and Imaging of the Operation and Performance of Thin-Film Field-Effect Transistors

Jeong, Kwangsik; Shin, Dong yeob; Park, Ji-Min; Yi, Dong-Joon; Hong, Hyunmin; Kim, Hyun-Suk; Chung, Kwun-Bum

ArticleIssue Date2025CitationAdvanced Science, v.12, no.5, pp 1 - 8PublisherWILEY
SCIESCOPUS
Organic/Inorganic Hybrid Top-Gate Transistors with Ultrahigh Electron Mobility via Enhanced Electron Pathwaysopen access

Park, Ji-Min; Lee, Hyunkyu; Lee, GunOh; Jang, Seong Cheol; Chang, Yun Hee; Hong, Hyunmin; Chung, Kwun-Bum; Lee, Kyung Jin; Kim, Dae Hwan; Kim, Hyun-Suk

ArticleIssue Date2023CitationACS Applied Materials & Interfaces, v.15, no.1, pp 1525 - 1534PublisherAmerican Chemical Society
SCIESCOPUS
Quantitative analysis of defect states in amorphous InGaZnO thin-film transistors using photoinduced current transient spectroscopy

Hong, Hyunmin; Jeong, Kwang-Sik; Lim, Jun Hyung; Son, Kyoung Seok; Chung, Kwun-Bum

ArticleIssue Date2021CitationJOURNAL OF APPLIED PHYSICS, v.130, no.1PublisherAMER INST PHYSICS
SCIESCOPUS
Quantitative analysis of defect states in InGaZnO within 2 eV below the conduction band via photo-induced current transient spectroscopyopen access

Hong, Hyunmin; Kim, Min Jung; Yi, Dong-Joon; Moon, Yeon-Keon; Son, Kyoung-Seok; Lim, Jun Hyung; Jeong, KwangSik; Chung, Kwun-Bum

ArticleIssue Date2023CitationScientific Reports, v.13, no.1PublisherNature Portfolio
SCIESCOPUS
Quantitative Dynamic Evolution of Unoccupied States in Hydrogen Diffused InGaZnSnO TFT under Positive Bias Temperature Stress

Hong, Hyunmin; Kim, Min Jung; Yi, Dong-Joon; Shin, Dong Yeob; Moon, Yeon-Keon; Son, Kyoung-Seok; Lim, Jun Hyung; Jeong, Kwang Sik; Chung, Kwun-Bum

ArticleIssue Date2024CitationACS Applied Electronic Materials, v.6, no.10, pp 7584 - 7590PublisherAmerican Chemical Society
SCIESCOPUS
Quantitative Insight of Annealing Atmosphere-Induced Device Performance and Bias Stability in a Ga-Doped InZnSnO Thin-Film Transistors

Choi, Nayoung; Kim, Min Jung; Hong, Hyunmin; Shin, Dong Yeob; Go, Jinyoung; Weldemhret, Teklebrahan Gebrekrstos; Jeong, Kwangsik; Chung, Kwun-Bum

ArticleIssue Date2024CitationIEEE Transactions on Electron Devices, v.71, no.9, pp 5393 - 5400PublisherIEEE
SCIESCOPUS
Silicone engineered anisotropic lithography for ultrahigh-density OLEDsopen access

Kweon, Hyukmin; Choi, Keun-Yeong; Park, Han Wool; Lee, Ryungyu; Jeong, Ukjin; Kim, Min Jung; Hong, Hyunmin; Ha, Borina; Lee, Sein; Kwon, Jang-Yeon, et al.

ArticleIssue Date2022CitationNature Communications, v.13, no.1, pp 1 - 10PublisherNature Portfolio
SCIESCOPUS
Swelling induced electrical detections and photo-induced current analysis in reduced graphene oxide for novel biosensing mechanisms

Lee, Seungjun; Hong, Hyunmin; Lee, Huiseop; Chung, Kwun-Bum; Kim, Jinsik

ArticleIssue Date2025CitationMeasurement, v.246, pp 1 - 8PublisherELSEVIER SCI LTD
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