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A Two-Step A/D Conversion and Column Self-Calibration Technique for Low Noise CMOS Image Sensorsopen access

Bae, Jaeyoung; Kim, Daeyun; Ham, Seokheon; Chae, Youngcheol; Song, Minkyu

ArticleIssue Date2014CitationSENSORS, v.14, no.7, pp 11825 - 11843PublisherMDPI
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