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Bipolar Resistive-Switching Phenomena and Resistive-Switching Mechanisms Observed in Zirconium Nitride-Based Resistive-Switching Memory Cells

Kim, Hee-Dong; An, Ho-Myoung; Sung, Yun Mo; Im, Hyunsik; Kim, Tae Geun

ArticleIssue Date2013CitationIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, v.13, no.1, pp 252 - 257PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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