ScholarWorks@Dongguk University

Surface and Interface Analysis

Journal Title

  • Surface and Interface Analysis

ISSN

  • E 1096-9918 | P 0142-2421

Publisher

  • John Wiley & Sons Inc.

Listed on(Coverage)

JCR 1997-2023
SJR 1999-2020;2022-2023
CiteScore 2011-2023
SCI 2010-2019
SCIE 2010-2024
CC 2016-2024
SCOPUS 2017-2024

Active

  • Active

    based on the information

    • SCOPUS:2024-10

Country

  • USA

Aime & Scopes

  • Surface and Interface Analysis is devoted to the publication of papers dealing with the development and application of techniques for the characterization of surfaces, interfaces and thin films. Papers dealing with standardization and quantification are particularly welcome, and also those which deal with the application of these techniques to industrial problems. Papers dealing with the purely theoretical aspects of the technique will also be considered. Review articles will be published; prior consultation with one of the Editors is advised in these cases. Papers must clearly be of scientific value in the field and will be submitted to two independent referees. Contributions must be in English and must not have been published elsewhere, and authors must agree not to communicate the same material for publication to any other journal.

Homepage

Article List

1 - 3 out of 3 results.

SCISCIESCOPUS
Surface characterization and London dispersive surface free energy of functionalized single-walled carbon nanotubes with a blend of polytetrafluoroethylene by inverse gas chromatography

Basivi, Praveen Kumar; Sreekanth, T. V. M.; Sivalingam, Ramesh; Thota, Chandrakalavathi; Pasupuleti, Visweswara Rao

ArticleIssue Date2019CitationSURFACE AND INTERFACE ANALYSIS, v.51, no.5, pp 516 - 524PublisherWILEY
SCISCIESCOPUS
Investigation of molar concentration effect on structural, optical, electrical, and photovoltaic properties of spray-coated Cu2O thin films

Prabu, R. David; Valanarasu, S.; Ganesh, V.; Shkir, Mohd; AlFaify, S.; Kathalingam, A.

ArticleIssue Date2018CitationSURFACE AND INTERFACE ANALYSIS, v.50, no.3, pp 346 - 353PublisherWILEY
SCISCIESCOPUS
Band alignment and defect states in amorphous GaInZnO thin films grown on SiO2/Si substrates

Heo, Sung; Chung, JaeGwan; Lee, Jae Cheol; Song, Taewon; Kim, Seong Heon; Yun, Dong-Jin; Lee, Hyung Ik; Kim, KiHong; Park, Gyeong Su; Oh, Jong Soo, et al.

ArticleIssue Date2016CitationSURFACE AND INTERFACE ANALYSIS, v.48, no.10, pp 1062 - 1065PublisherWILEY-BLACKWELL
1
CONTACT US

RSS_1.0 RSS_2.0 ATOM_1.0

30, Pildong-ro 1-gil, Jung-gu, Seoul, 04620, Republic of Korea+82-2-2260-3114

Copyright(c) 2023 DONGGUK UNIVERSITY. ALL RIGHTS RESERVED.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

BROWSE

한국어