상세 보기
Defect analysis in amorphous indium gallium tin zinc oxide thin film transistor during the post annealing treatment
- 제목
- Defect analysis in amorphous indium gallium tin zinc oxide thin film transistor during the post annealing treatment
- 저자
- 정권범
- 발행일
- 2022-07-19
- 학회명
- ISPSA
- 개최국가
- 대한민국