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- Jeon, Yoonmo;
- Lee, Seunghun;
- Kim, Woongsup
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Featured Application The proposed framework enables the deployment of robust Vision-Language Models on resource-constrained off-the-shelf edge devices, such as the NVIDIA Jetson series. Its primary application is real-time disaster damage assessment using satellite imagery in communication-denied environments, facilitating immediate decision-making for first responders.Abstract The deployment of Vision-Language Models (VLMs) in Satellite IoT scenarios is critical for real-time disaster assessment but is often hindered by the substantial memory and compute requirements of state-of-the-art models. While parameter-efficient fine-tuning (PEFT) enables adaptation, with minimal computational overhead, standard supervised methods often fail to ensure robustness and reliability on resource-constrained edge devices. To address this, we propose EdgeV-SE, a self-reflective fine-tuning framework that significantly enhances the performance of VLM without introducing any inference-time overhead. Our framework incorporates an uncertainty-aware self-reflection mechanism with asymmetric dual pathways: a generative linguistic pathway and an auxiliary discriminative visual pathway. By estimating uncertainty from the linguistic pathway using a log-likelihood margin between class verbalizers, EdgeV-SE identifies ambiguous samples and refines its decision boundaries via consistency regularization and cross-pathway mutual learning. Experimental results on hurricane damage assessment demonstrate that our approach improves image classification accuracy, enhances image-text semantic alignment, and achieves superior caption quality. Notably, our work achieves these gains while maintaining practical deployment on a commercial off-the-shelf edge device such as NVIDIA Jetson Orin Nano, preserving the inference latency and memory footprint. Overall, our work contributes a unified self-reflective fine-tuning framework that improves robustness, calibration, and deployability of VLMs on edge devices.
키워드
- 제목
- EdgeV-SE: Self-Reflective Fine-Tuning Framework for Edge-Deployable Vision-Language Models
- 저자
- Jeon, Yoonmo; Lee, Seunghun; Kim, Woongsup
- 발행일
- 2026-01
- 유형
- Article
- 저널명
- Applied Sciences
- 권
- 16
- 호
- 2
- 페이지
- 1 ~ 31