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Quantitative interfacial defect analysis in high mobility InSnZnO thin film transistor by the measurement of ac transconductance
- 제목
- Quantitative interfacial defect analysis in high mobility InSnZnO thin film transistor by the measurement of ac transconductance
- 저자
- 정권범
- 발행일
- 2024-05-28
- 학회명
- European Materials Research Society (EMRS)