A One-Shot Digital Correlated Double Sampling with a Differential Difference Amplifier for a High Speed CMOS Image Sensor

  • Son, Suho
  • Jeon, Shiwon
  • Namgung, Seol
  • Yoo, Jieun
  • Song, Minkyu
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초록

In order to raise the operating speed of a CMOS image sensor (CIS), a new technique of digital correlated double sampling (CDS) is described. In general, a fixed pattern noise (FPN) of a CIS has been reduced with the subtraction algorithm between the reset signal and pixel signal. This is because a single-slope analog-to-digital converter (ADC) has been normally adopted in the conventional digital CDS with the reset ramp and signal ramp. Thus, the operating speed of a digital CDS is much slower than that of an analog CDS. In order to improve the operating speed, we propose a one-shot digital CDS based on a differential difference amplifier (DDA) that compares the reset signal and the pixel signal using only one ramp. The prototype CIS has been fabricated with 0.13 mu m CIS technology and it has the VGA resolution of 640x480. The measured conversion time is 16 mu s, and a high frame rate of 131fps is achieved at the VGA resolution.

키워드

one-shot digital correlated double samplingfixed pattern noisedifferential difference amplifierCMOS Image Sensor
제목
A One-Shot Digital Correlated Double Sampling with a Differential Difference Amplifier for a High Speed CMOS Image Sensor
저자
Son, SuhoJeon, ShiwonNamgung, SeolYoo, JieunSong, Minkyu
DOI
10.1109/ISCAS.2015.7168818
발행일
2015-07
유형
Proceedings Paper
저널명
2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS)
2015-July
페이지
1054 ~ 1057