상세 보기
Unraveling the Issue of Ag Migration in Printable Source/Drain Electrodes Compatible with Versatile Solution-Processed Oxide Semiconductors for Printed Thin-Film Transistor Applications
- Hong, Gyu Ri;
- Lee, Sun Sook;
- Park, Hye Jin;
- Jo, Yejin;
- Kim, Ju Young;
- ... Chung, Kwun-Bum;
- 외 6명
Citations
WEB OF SCIENCE
12Citations
SCOPUS
12초록
In recent decades, solution-processable, printable oxide thin-film transistors have garnered a tremendous amount of attention given their potential for use in low-cost, large-area electronics. However, printable metallic source/drain electrodes undergo undesirable electrical/thermal migration at an interfacial stack of the oxide semiconductor and metal electrode. In this study, we report oleic acid-capped Ag nanoparticles that effectively suppress the significant Ag migration and facilitate high field-effect mobilities in oxide transistors. The origin of the role of surface-capped Ag nanoparticles is clarified with comparative studies based on X-ray photoelectron spectroscopy and X-ray absorption spectroscopy.
키워드
migration; print; solution-process; transistor; FIELD-EFFECT TRANSISTORS; FREE CU NANOPARTICLES; ZINC-OXIDE; PERFORMANCE; INK; TEMPERATURE; FEATURES; DESIGN; LAYER
- 제목
- Unraveling the Issue of Ag Migration in Printable Source/Drain Electrodes Compatible with Versatile Solution-Processed Oxide Semiconductors for Printed Thin-Film Transistor Applications
- 저자
- Hong, Gyu Ri; Lee, Sun Sook; Park, Hye Jin; Jo, Yejin; Kim, Ju Young; Lee, Hoi Sung; Kang, Yun Chan; Ryu, Beyong-Hwan; Song, Aeran; Chung, Kwun-Bum; Choi, Youngmin; Jeong, Sunho
- 발행일
- 2017-04-26
- 유형
- Article
- 권
- 9
- 호
- 16
- 페이지
- 14058 ~ 14066
- 언어
- ENG
- 출판사
- AMER CHEMICAL SOC
- 발행국가
- 미국
- 분량
- 9 페이지
- ISSN
- E 1944-8252
P 1944-8244