ScholarWorks@동국대학교

상세 보기

Exoelectron emission spectroscopy and capacitance transient spectroscopy for deeper nitride charge trap in ONO structures

  • 조훈영
제목
Exoelectron emission spectroscopy and capacitance transient spectroscopy for deeper nitride charge trap in ONO structures
저자
조훈영
발행일
2009-06-10
학회명
EMRS 2009
개최지
스트라스브르그
학회 개최일
2009-06-08 ~ 2009-06-12

ScholarWorks@동국대학교

04620 서울특별시 중구 필동로 1길 30 동국대학교 Tel. 02-2260-3114

COPYRIGHT © 동국대학교 All Rights Reserved.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.

You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.