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Influence of Quantum well Thickness Fluctuation on Optical Properties of InGaN/GaN Multi Quantum well Structure Grown by PA-MBE
- Woo, Hyeonseok;
- Kim, Jongmin;
- Cho, Sangeun;
- Jo, Yongcheol;
- Roh, Cheong Hyun;
- 외 3명
초록
An InGaN/GaN multiple quantum well (MQW) structure is grown on a GaN/sapphire template using a plasma-assisted molecular beam epitaxy (PA-MBE). The fluctuation of the quantum well thickness formed from roughly-grown InGaN layer results in a disordered photoluminescence (PL) spectrum. The surface morphologies of the InGaN layers with various In compositions are investigated by reflection high energy electron diffraction (RHEED) and atomic force microscopy (AFM). A blurred InGaN/GaN hetero-interface and the non-uniform QW size is confirmed by high resolution transmission electron microscopy (HR-TEM). Inhomogeneity of the quantum confinement results in a degradation of the quantum efficiency even though the InGaN layer has a uniform In composition.
키워드
- 제목
- Influence of Quantum well Thickness Fluctuation on Optical Properties of InGaN/GaN Multi Quantum well Structure Grown by PA-MBE
- 저자
- Woo, Hyeonseok; Kim, Jongmin; Cho, Sangeun; Jo, Yongcheol; Roh, Cheong Hyun; Kim, Hyungsang; Hahn, Cheol-Koo; Im, Hyunsik
- 발행일
- 2017-05
- 유형
- Article
- 저널명
- 한국진공학회지
- 권
- 26
- 호
- 3
- 페이지
- 52 ~ 54