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Nonlinear Profile monitoring for Intelligent Quality Diagnosis: Focusing on Using Wavelet
- 제목
- Nonlinear Profile monitoring for Intelligent Quality Diagnosis: Focusing on Using Wavelet
- 저자
- 정욱
- 발행일
- 2016-07-31
- 학회명
- The 15th China-Korea Bilateral Symposium on Quality
- 개최지
- Nanjing University of Science & Technology
- 학회 개최일
- 2016-07-30 ~ 2016-08-01