Multi-Level Resistive Switching of Pt/HfO2/TaN Memory Device

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초록

This work characterizes resistive switching and neuromorphic simulation of Pt/HfO2/TaN stack as an artificial synaptic device. A stable bipolar resistive switching operation is performed by repetitive DC sweep cycles. Furthermore, endurance (DC 100 cycles) and retention (5000 s) are demonstrated for reliable resistive operation. Low-resistance and high-resistance states follow the Ohmic conduction and Poole-Frenkel emission, respectively, which is verified through the fitting process. For practical operation, the set and reset processes are performed through pulses. Further, potentiation and depression are demonstrated for neuromorphic application. Finally, neuromorphic system simulation is performed through a neural network for pattern recognition accuracy of the Fashion Modified National Institute of Standards and Technology dataset.

키워드

memristorthreshold switchingresistive switchingmetal oxidesMECHANISMSBEHAVIORS
제목
Multi-Level Resistive Switching of Pt/HfO2/TaN Memory Device
저자
Ryu, HojeongJung, HoejeLee, KisongKim, Sungjun
DOI
10.3390/met11121885
발행일
2021-12
유형
Article
저널명
Metals
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