Tuning the hole transporting layer using the NiO@X2C (X = W or Mo) composites for polymer solar cells and X-ray detectors
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초록

In this paper, we showcased the augmentation in power conversion efficiency (PCE) and photodetectivity of bulk heterojunction (BHJ) organic solar cells and photodetectors through the integration of functionalized metal carbides interacted NiO composites with PEDOT:PSS as a hole transport (HT) material. The 2D metal carbides (Mo2C and W2C), quintessential representatives of the MXenes family, integrated NiO were synthesized and employed to tune the HT in BHJ solar cells and photodetectors. These materials exhibit exceptional electronic conductivity, high mobility, enhanced electron extraction, excellent optical transparency, and desirable mechanical properties, rendering them as ideal candidates for enhancing the performance of BHJ devices. The constructed devices with NiO@Mo2C and NiO@W2C blended PEDOT:PSS HT achieved a PCE of similar to 7.49 % and similar to 8.32 %, representing the similar to 28 % and similar to 43 % improvement, respectively compared to the PCE obtained with the pure PEDOT:PSS active layer (PCE = 5.86 %). Additionally, the photodetector utilizing the NiO@Mo2C and NiO@W2C blended PEDOT:PSS HT demonstrated a maximum sensitivity of 2.25 and 2.62 mA/Gy center dot cm(2) better than the pure HT under X-ray irradiation. This work suggests the integration of 2D metal carbides integrated NiO into the HT as a promising approach to enhance the efficiency of BHJ devices.

키워드

NiOMetal carbidesPhotodetectorsSolar cellsPEDOTPSSBulk heterojunctionREDUCED GRAPHENE OXIDEHIGHLY EFFICIENTSPECTROSCOPYSENSITIVITY
제목
Tuning the hole transporting layer using the NiO@X2C (X = W or Mo) composites for polymer solar cells and X-ray detectors
저자
Liu, HailiangHussain, SajjadSheikh, Zulfqar AliAftab, SikandarKaruppasamy, K.Al-Enizi, Abdullah M.Maiyalagan, T.Alfantazi, AkramKim, Hyun-SeokJung, JongwanKim, Deok-KeeVikraman, DhanasekaranKang, Jungwon
DOI
10.1016/j.surfin.2024.105027
발행일
2024-10
유형
Article
저널명
Surfaces and Interfaces
53
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1 ~ 12