ScholarWorks@동국대학교

상세 보기

Deep-Level Defects on Nitrogen-doped ZnO thin films by Photocurrent Transient Spectroscopy

  • 조훈영
제목
Deep-Level Defects on Nitrogen-doped ZnO thin films by Photocurrent Transient Spectroscopy
저자
조훈영
발행일
2013-07-25
학회명
International Conference on Defects in Semiconductors
개최지
볼로냐
학회 개최일
2013-07-21 ~ 2013-07-26

ScholarWorks@동국대학교

04620 서울특별시 중구 필동로 1길 30 동국대학교 Tel. 02-2260-3114

COPYRIGHT © 동국대학교 All Rights Reserved.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.

You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.