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Correlation between Optical Localization-State and Electrical Deep-Level State in In0.52Al0.48As/In0.53Ga0.47As Quantum Well Structure
- Ahn, Il-Ho;
- Kim, Deuk Young;
- Lee, Sejoon
WEB OF SCIENCE
4SCOPUS
4초록
The peculiar correlationship between the optical localization-state and the electrical deep-level defect-state was observed in the In0.52Al0.48As/In0.53Ga0.47As quantum well structure that comprises two quantum-confined electron-states and two hole-subbands. The sample clearly exhibited the Fermi edge singularity (FES) peak in its photoluminescence spectrum at 10-300 K; and the FES peak was analyzed in terms of the phenomenological line shape model with key physical parameters such as the Fermi energy, the hole localization energy, and the band-to-band transition amplitude. Through the comprehensive studies on both the theoretical calculation and the experimental evaluation of the energy band profile, we found out that the localized state, which is separated above by similar to 0.07 eV from the first excited hole-subband, corresponds to the deep-level state, residing at the position of similar to 0.75 eV far below the conduction band (i.e., near the valence band edge).
키워드
- 제목
- Correlation between Optical Localization-State and Electrical Deep-Level State in In0.52Al0.48As/In0.53Ga0.47As Quantum Well Structure
- 저자
- Ahn, Il-Ho; Kim, Deuk Young; Lee, Sejoon
- 발행일
- 2021-03
- 유형
- Article
- 저널명
- NANOMATERIALS
- 권
- 11
- 호
- 3
- 페이지
- 1 ~ 8
- 언어
- ENG
- 출판사
- MDPI
- 발행국가
- 스위스
- 분량
- 8 페이지
- ISSN
- E 2079-4991
P 2079-4991