Forming-Free Tunable Analog Switching in WOx/TaOx Heterojunction for Emulating Electronic Synapses

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초록

In this work, the sputtered deposited WOx/TaOx switching layer has been studied for resistive random-access memory (RRAM) devices. Gradual SET and RESET behaviors with reliable device-to-device variability were obtained with DC voltage sweep cycling without an electroforming process. The memristor shows uniform switching characteristics, low switching voltages, and a high R-ON/R-OFF ratio (similar to 10(2)). The transition from short-term plasticity (STP) to long-term potentiation (LTP) can be observed by increasing the pulse amplitude and number. Spike-rate-dependent plasticity (SRDP) and paired-pulse facilitation (PPF) learning processes were successfully emulated by sequential pulse trains. By reducing the pulse interval, the synaptic weight change increases due to the residual oxygen vacancy near the conductive filaments (CFs). This work explores mimicking the biological synaptic behavior and further development for next-generation neuromorphic applications.

키워드

WOxTaOx bilayergradual resistive switchingsynaptic plasticityshort-term plasticitylong-term potentiationspike-rate-dependent plasticityTAOX-BASED RRAMDEVICEMEMRISTORSMECHANISM
제목
Forming-Free Tunable Analog Switching in WOx/TaOx Heterojunction for Emulating Electronic Synapses
저자
Mahata, ChandreswarPyo, JuyeongJeon, BeomkiIsmail, MuhammadKang, MyounggonKim, Sungjun
DOI
10.3390/ma15248858
발행일
2022-12
유형
Article
저널명
Materials
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