Synaptic Characteristics from Homogeneous Resistive Switching in Pt/Al2O3/TiN Stack

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초록

In this work, we propose three types of resistive switching behaviors by controlling operation conditions. We confirmed well-known filamentary switching in Al2O3-based resistive switching memory using the conventional device working operation with a forming process. Here, filamentary switching can be classified into two types depending on the compliance current. On top of that, the homogeneous switching is obtained by using a negative differential resistance effect before the forming or setting process in a negative bias. The variations of the low-resistance and high-resistance states in the homogeneous switching are comparable to the filamentary switching cases. However, the drift characteristics of the low-resistance and high-resistance states in the homogeneous switching are unstable with time. Therefore, the short-term plasticity effects, such as the current decay in repeated pulses and paired pulses facilitation, are demonstrated when using the resistance drift characteristics. Finally, the conductance can be increased and decreased by 50 consecutive potentiation pulses and 50 consecutive depression pulses, respectively. The linear conductance update in homogeneous switching is achieved compared to the filamentary switching, which ensures the high pattern-recognition accuracy.

키워드

memristorsynapse deviceneuromorphic computinghomogeneous resistive switchingFILAMENTARYMEMRISTORSMEMORY
제목
Synaptic Characteristics from Homogeneous Resistive Switching in Pt/Al2O3/TiN Stack
저자
Ryu, HojeongKim, Sungjun
DOI
10.3390/nano10102055
발행일
2020-10
유형
Article
저널명
NANOMATERIALS
10
10
페이지
1 ~ 11