상세 보기
- Jang, Junwon;
- Kim, Seongmin;
- Park, Suyong;
- Kim, Soomin;
- Kim, Sungjun;
- 외 1명
WEB OF SCIENCE
4SCOPUS
5초록
This paper explores the integration of indium-gallium-zinc oxide (IGZO)-based 2-transistor 0-capacitor dynamic random-access memory (2T0C DRAM, or shortly, 2T DRAM) into reservoir computing for advanced semiconductor artificial intelligence (AI) applications. The short-term memory characteristics of IGZO 2T DRAM enable rapid read-write speeds essential for processing time-varying input data. Experimental results confirm high on/off ratios and leaky retention behaviors. The study also examines paired-pulse facilitation (PPF) phenomena, offering insights into reinforcement mechanisms for cognitive computing. Finally, the reservoir computing approach achieves notable pattern recognition accuracy with a 4-bit pulse scheme, showcasing its effectiveness in complex data sets. [GRAPHICS]
키워드
- 제목
- Leaky 2T Dynamic Random-Access Memory Devices Based on Nanometer-Thick Indium-Gallium-Zinc-Oxide Films for Reservoir Computing
- 저자
- Jang, Junwon; Kim, Seongmin; Park, Suyong; Kim, Soomin; Kim, Sungjun; Cho, Seongjae
- 발행일
- 2024-10
- 유형
- Article
- 저널명
- ACS Applied Nano Materials
- 권
- 7
- 호
- 19
- 페이지
- 22430 ~ 22435