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초록
Effects of the N2O plasma treatment (PT) on perhydropolysilazane spin-on-dielectric (PHPS SOD) were examined as potential inter-layer-dielectrics (ILDs) for sub-30 nm Si circuits. The spin-coated PHPS (18.5 wt.%) ILD layers converted at 650 degrees C were integrated with the 0.18 mu m Si front-end-of-the line process. A modified contact pre-cleaning scheme using N2O PT produced more uniform and stable contact chain resistances from the SOD ILDs than the case of pre-cleaning only by buffered oxide etcher. Our analysis shows that this enhancement is due to the minimized carbon contamination on the PHPS side-wall surface densified by PT. (C) 2013 Elsevier B.V. All rights reserved.
키워드
Perhydropolysilazane; Spin-on-dielectric; N2O plasma treatment; Inter-layer-dielectric; THIN-FILMS
- 제목
- Effects of N2O plasma treatment on perhydropolysilazane spin-on-dielectrics for inter-layer-dielectric applications
- 저자
- Park, Kyoung-Seok; Ko, Pil-Seok; Kim, Sam-Dong
- 발행일
- 2014-01-31
- 유형
- Article
- 저널명
- Thin Solid Films
- 권
- 551
- 페이지
- 57 ~ 60