Effects of N2O plasma treatment on perhydropolysilazane spin-on-dielectrics for inter-layer-dielectric applications

  • Park, Kyoung-Seok
  • Ko, Pil-Seok
  • Kim, Sam-Dong
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초록

Effects of the N2O plasma treatment (PT) on perhydropolysilazane spin-on-dielectric (PHPS SOD) were examined as potential inter-layer-dielectrics (ILDs) for sub-30 nm Si circuits. The spin-coated PHPS (18.5 wt.%) ILD layers converted at 650 degrees C were integrated with the 0.18 mu m Si front-end-of-the line process. A modified contact pre-cleaning scheme using N2O PT produced more uniform and stable contact chain resistances from the SOD ILDs than the case of pre-cleaning only by buffered oxide etcher. Our analysis shows that this enhancement is due to the minimized carbon contamination on the PHPS side-wall surface densified by PT. (C) 2013 Elsevier B.V. All rights reserved.

키워드

PerhydropolysilazaneSpin-on-dielectricN2O plasma treatmentInter-layer-dielectricTHIN-FILMS
제목
Effects of N2O plasma treatment on perhydropolysilazane spin-on-dielectrics for inter-layer-dielectric applications
저자
Park, Kyoung-SeokKo, Pil-SeokKim, Sam-Dong
DOI
10.1016/j.tsf.2013.11.104
발행일
2014-01-31
유형
Article
저널명
Thin Solid Films
551
페이지
57 ~ 60