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The correlation between electrical properties and quantitative defect analysis as a function of electrode junction type of amorphous indium tin zinc oxide thin film transistor
- 제목
- The correlation between electrical properties and quantitative defect analysis as a function of electrode junction type of amorphous indium tin zinc oxide thin film transistor
- 저자
- 정권범
- 발행일
- 2024-10-28
- 학회명
- The 7th intenational conference on active materials and soft mechanics (AMSM2024)