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Van der Waals Heteroepitaxy of Te Crystallites/2H-MoTe2 Atomically Thin Films on GaAs Substrates by Using Metal-Organic Chemical-Vapor Deposition
- Kim, Tae Wan;
- Kim, Donghwan;
- Jo, Yonghee;
- Park, Jonghoo;
- Kim, Hyun-Seok;
- 외 1명
WEB OF SCIENCE
2SCOPUS
2초록
Te crystallites/few atomic-layer MoTe2 films grown on (100) GaAs substrates by using metal-organic chemical - vapor deposition (MOCVD) were investigated. MOCVD provides high-quality films, controllable film thickness, composition uniformity, and scalability to wafer scale size via the pyrolysis process of metal-organic sources. We observed several tens of nanometers of Te crystallites/three atomic layers 2H phase MoTe2 on the GaAs substrates. This observation was confirmed by using Raman spectroscopy, X-ray photoemission spectroscopy (XPS), atomic force microscopy, cross-sectional scanning transmission electron microscopy and energy dispersive X-ray spectroscopy. A two-dimensional transition-metal dichalcogenide deposited on GaAs by using the van der Waals epitaxy is a promising method for the development of future high-performance optoelectronic and electronic devices.
키워드
- 제목
- Van der Waals Heteroepitaxy of Te Crystallites/2H-MoTe2 Atomically Thin Films on GaAs Substrates by Using Metal-Organic Chemical-Vapor Deposition
- 저자
- Kim, Tae Wan; Kim, Donghwan; Jo, Yonghee; Park, Jonghoo; Kim, Hyun-Seok; Shin, ChaeHo
- 발행일
- 2020-01
- 유형
- Article
- 권
- 76
- 호
- 2
- 페이지
- 167 ~ 170