Van der Waals Heteroepitaxy of Te Crystallites/2H-MoTe2 Atomically Thin Films on GaAs Substrates by Using Metal-Organic Chemical-Vapor Deposition

  • Kim, Tae Wan
  • Kim, Donghwan
  • Jo, Yonghee
  • Park, Jonghoo
  • Kim, Hyun-Seok
  • 외 1명
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초록

Te crystallites/few atomic-layer MoTe2 films grown on (100) GaAs substrates by using metal-organic chemical - vapor deposition (MOCVD) were investigated. MOCVD provides high-quality films, controllable film thickness, composition uniformity, and scalability to wafer scale size via the pyrolysis process of metal-organic sources. We observed several tens of nanometers of Te crystallites/three atomic layers 2H phase MoTe2 on the GaAs substrates. This observation was confirmed by using Raman spectroscopy, X-ray photoemission spectroscopy (XPS), atomic force microscopy, cross-sectional scanning transmission electron microscopy and energy dispersive X-ray spectroscopy. A two-dimensional transition-metal dichalcogenide deposited on GaAs by using the van der Waals epitaxy is a promising method for the development of future high-performance optoelectronic and electronic devices.

키워드

TMDsMoTe2MOCVDHeterostructureIII-V semiconductorGROWTH
제목
Van der Waals Heteroepitaxy of Te Crystallites/2H-MoTe2 Atomically Thin Films on GaAs Substrates by Using Metal-Organic Chemical-Vapor Deposition
저자
Kim, Tae WanKim, DonghwanJo, YongheePark, JonghooKim, Hyun-SeokShin, ChaeHo
DOI
10.3938/jkps.76.167
발행일
2020-01
유형
Article
저널명
Journal of the Korean Physical Society
76
2
페이지
167 ~ 170