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Quantitative analysis of defect states in In-based amorphous oxide semiconductors via differential reflectance transient spectroscopy
- 제목
- Quantitative analysis of defect states in In-based amorphous oxide semiconductors via differential reflectance transient spectroscopy
- 저자
- 정권범
- 발행일
- 2025-05-28
- 학회명
- European Materials Research Society (EMRS)