Detailed Information

Cited 6 time in webofscience Cited 5 time in scopus
Metadata Downloads

Mobility-Spectrum Analysis of an Anisotropic Material System with a Single-Valley Indirect-Band-Gap Semiconductor Quantum-Well

Full metadata record
DC Field Value Language
dc.contributor.authorJoung, Hodoug-
dc.contributor.authorAhn, Il-Ho-
dc.contributor.authorYang, Woochul-
dc.contributor.authorKim, Deuk Young-
dc.date.accessioned2023-04-28T06:42:17Z-
dc.date.available2023-04-28T06:42:17Z-
dc.date.issued2018-11-
dc.identifier.issn1738-8090-
dc.identifier.issn2093-6788-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/8960-
dc.description.abstractFull maximum-entropy mobility-spectrum analysis (FMEMSA) is the best algorithm among mobility spectrum analyses by which we can obtain a set of partial-conductivities associated with mobility values (mobility spectrum) by analyzing magnetic-field-dependent conductivity-tensors. However, it is restricted to a direct band-gap semiconductor and should be modified for materials with other band structures. We developed the modified version of FMEMSA which is appropriate for a material with a single anisotropic valley, or an indirect-band-gap semiconductor quantum-well with a single non-degenerate conduction-band valley e.g., (110)-oriented AlAs quantum wells with a single anisotropic valley. To demonstrate the reliability of the modified version, we applied it to several sets of synthetic measurement datasets. The results demonstrated that, unlike existing FMEMSA, the modified version could produce accurate mobility spectra of materials with a single anisotropic valley. [GRAPHICS] .-
dc.format.extent10-
dc.language영어-
dc.language.isoENG-
dc.publisherKOREAN INST METALS MATERIALS-
dc.titleMobility-Spectrum Analysis of an Anisotropic Material System with a Single-Valley Indirect-Band-Gap Semiconductor Quantum-Well-
dc.typeArticle-
dc.publisher.location대한민국-
dc.identifier.doi10.1007/s13391-018-0081-7-
dc.identifier.scopusid2-s2.0-85052806387-
dc.identifier.wosid000443991500014-
dc.identifier.bibliographicCitationELECTRONIC MATERIALS LETTERS, v.14, no.6, pp 774 - 783-
dc.citation.titleELECTRONIC MATERIALS LETTERS-
dc.citation.volume14-
dc.citation.number6-
dc.citation.startPage774-
dc.citation.endPage783-
dc.type.docTypeArticle-
dc.identifier.kciidART002402515-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.subject.keywordPlusELECTRONS-
dc.subject.keywordPlusHOLES-
dc.subject.keywordAuthorMaximum-entropy mobility-spectrum analysis (MEMSA)-
dc.subject.keywordAuthorFull maximum-entropy mobility-spectrum analysis (FMEMSA)-
dc.subject.keywordAuthorMobility-spectrum analysis (MSA)-
dc.subject.keywordAuthorHall effect-
dc.subject.keywordAuthorAnisotropic single valley-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Natural Science > Division of Physics & Semiconductor Science > 1. Journal Articles
College of Natural Science > Department of Physics > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Yang, Woo Chul photo

Yang, Woo Chul
College of Natural Science (Department of Physics)
Read more

Altmetrics

Total Views & Downloads

BROWSE