Cited 5 time in
Mobility-Spectrum Analysis of an Anisotropic Material System with a Single-Valley Indirect-Band-Gap Semiconductor Quantum-Well
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Joung, Hodoug | - |
| dc.contributor.author | Ahn, Il-Ho | - |
| dc.contributor.author | Yang, Woochul | - |
| dc.contributor.author | Kim, Deuk Young | - |
| dc.date.accessioned | 2023-04-28T06:42:17Z | - |
| dc.date.available | 2023-04-28T06:42:17Z | - |
| dc.date.issued | 2018-11 | - |
| dc.identifier.issn | 1738-8090 | - |
| dc.identifier.issn | 2093-6788 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/8960 | - |
| dc.description.abstract | Full maximum-entropy mobility-spectrum analysis (FMEMSA) is the best algorithm among mobility spectrum analyses by which we can obtain a set of partial-conductivities associated with mobility values (mobility spectrum) by analyzing magnetic-field-dependent conductivity-tensors. However, it is restricted to a direct band-gap semiconductor and should be modified for materials with other band structures. We developed the modified version of FMEMSA which is appropriate for a material with a single anisotropic valley, or an indirect-band-gap semiconductor quantum-well with a single non-degenerate conduction-band valley e.g., (110)-oriented AlAs quantum wells with a single anisotropic valley. To demonstrate the reliability of the modified version, we applied it to several sets of synthetic measurement datasets. The results demonstrated that, unlike existing FMEMSA, the modified version could produce accurate mobility spectra of materials with a single anisotropic valley. [GRAPHICS] . | - |
| dc.format.extent | 10 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | KOREAN INST METALS MATERIALS | - |
| dc.title | Mobility-Spectrum Analysis of an Anisotropic Material System with a Single-Valley Indirect-Band-Gap Semiconductor Quantum-Well | - |
| dc.type | Article | - |
| dc.publisher.location | 대한민국 | - |
| dc.identifier.doi | 10.1007/s13391-018-0081-7 | - |
| dc.identifier.scopusid | 2-s2.0-85052806387 | - |
| dc.identifier.wosid | 000443991500014 | - |
| dc.identifier.bibliographicCitation | ELECTRONIC MATERIALS LETTERS, v.14, no.6, pp 774 - 783 | - |
| dc.citation.title | ELECTRONIC MATERIALS LETTERS | - |
| dc.citation.volume | 14 | - |
| dc.citation.number | 6 | - |
| dc.citation.startPage | 774 | - |
| dc.citation.endPage | 783 | - |
| dc.type.docType | Article | - |
| dc.identifier.kciid | ART002402515 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.description.journalRegisteredClass | kci | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
| dc.subject.keywordPlus | ELECTRONS | - |
| dc.subject.keywordPlus | HOLES | - |
| dc.subject.keywordAuthor | Maximum-entropy mobility-spectrum analysis (MEMSA) | - |
| dc.subject.keywordAuthor | Full maximum-entropy mobility-spectrum analysis (FMEMSA) | - |
| dc.subject.keywordAuthor | Mobility-spectrum analysis (MSA) | - |
| dc.subject.keywordAuthor | Hall effect | - |
| dc.subject.keywordAuthor | Anisotropic single valley | - |
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