Cited 0 time in
Record-High Performance Trantenna based on Asymmetric Nano-Ring FET for Polarization-Independent Large-Scale/Real-Time THz Imaging
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jang, E-San | - |
| dc.contributor.author | Ryu, M. W. | - |
| dc.contributor.author | Patel, R. | - |
| dc.contributor.author | Ahn, S. H. | - |
| dc.contributor.author | Jeon, H. J. | - |
| dc.contributor.author | Han, K. J. | - |
| dc.contributor.author | Kim, K. R. | - |
| dc.date.accessioned | 2023-04-28T05:42:38Z | - |
| dc.date.available | 2023-04-28T05:42:38Z | - |
| dc.date.issued | 2019-06 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/8644 | - |
| dc.description.abstract | We demonstrate a record-high performance monolithic trantenna (transistor-antenna) using 65-nm CMOS foundry in the field of a plasmonic terahertz (THz) detector, By applying ultimate structural asymmetry between source and drain on a ring FET with source diameter (d(S)) scaling from 30 to 0.38 mu m, we obtained 180 times more enhanced photoresponse (Delta u) in on-chip THz measurement. Through free-space THz imaging experiments, the conductive drain region of ring FET itself showed a frequency sensitivity with resonance frequency at 0.12 THz in 0.09 similar to 0.2 THz range and polarization-independent imaging results as an isotropic circular antenna. Highly scalable and feeding line-free monolithic trantenna enables a high-performance THz detector with responsivity of 8.8 kV/W and NEP of 3.36 pW/Hz(0.5) at the target frequency. | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | IEEE | - |
| dc.title | Record-High Performance Trantenna based on Asymmetric Nano-Ring FET for Polarization-Independent Large-Scale/Real-Time THz Imaging | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.23919/VLSIC.2019.8778116 | - |
| dc.identifier.scopusid | 2-s2.0-85073910689 | - |
| dc.identifier.wosid | 000531736500116 | - |
| dc.identifier.bibliographicCitation | 2019 SYMPOSIUM ON VLSI CIRCUITS, v.2019-June, pp T160 - T161 | - |
| dc.citation.title | 2019 SYMPOSIUM ON VLSI CIRCUITS | - |
| dc.citation.volume | 2019-June | - |
| dc.citation.startPage | T160 | - |
| dc.citation.endPage | T161 | - |
| dc.type.docType | Proceedings Paper | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
30, Pildong-ro 1-gil, Jung-gu, Seoul, 04620, Republic of Korea+82-2-2260-3114
Copyright(c) 2023 DONGGUK UNIVERSITY. ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.
