Cited 38 time in
False Positive RFID Detection Using Classification Models
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Alfian, Ganjar | - |
| dc.contributor.author | Syafrudin, Muhammad | - |
| dc.contributor.author | Yoon, Bohan | - |
| dc.contributor.author | Rhee, Jongtae | - |
| dc.date.accessioned | 2023-04-28T04:42:10Z | - |
| dc.date.available | 2023-04-28T04:42:10Z | - |
| dc.date.issued | 2019-03-02 | - |
| dc.identifier.issn | 2076-3417 | - |
| dc.identifier.issn | 2076-3417 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/8303 | - |
| dc.description.abstract | Radio frequency identification (RFID) is an automated identification technology that can be utilized to monitor product movements within a supply chain in real-time. However, one problem that occurs during RFID data capturing is false positives (i.e., tags that are accidentally detected by the reader but not of interest to the business process). This paper investigates using machine learning algorithms to filter false positives. Raw RFID data were collected based on various tagged product movements, and statistical features were extracted from the received signal strength derived from the raw RFID data. Abnormal RFID data or outliers may arise in real cases. Therefore, we utilized outlier detection models to remove outlier data. The experiment results showed that machine learning-based models successfully classified RFID readings with high accuracy, and integrating outlier detection with machine learning models improved classification accuracy. We demonstrated the proposed classification model could be applied to real-time monitoring, ensuring false positives were filtered and hence not stored in the database. The proposed model is expected to improve warehouse management systems by monitoring delivered products to other supply chain partners. | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | MDPI | - |
| dc.title | False Positive RFID Detection Using Classification Models | - |
| dc.type | Article | - |
| dc.publisher.location | 스위스 | - |
| dc.identifier.doi | 10.3390/app9061154 | - |
| dc.identifier.scopusid | 2-s2.0-85063742643 | - |
| dc.identifier.wosid | 000465017200112 | - |
| dc.identifier.bibliographicCitation | APPLIED SCIENCES-BASEL, v.9, no.6 | - |
| dc.citation.title | APPLIED SCIENCES-BASEL | - |
| dc.citation.volume | 9 | - |
| dc.citation.number | 6 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | Y | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Chemistry | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Multidisciplinary | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | LOCAL OUTLIER FACTOR | - |
| dc.subject.keywordPlus | COMPONENT ANALYSIS | - |
| dc.subject.keywordAuthor | RFID | - |
| dc.subject.keywordAuthor | RSS | - |
| dc.subject.keywordAuthor | machine learning | - |
| dc.subject.keywordAuthor | classification | - |
| dc.subject.keywordAuthor | false positive | - |
| dc.subject.keywordAuthor | outlier detection | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
30, Pildong-ro 1-gil, Jung-gu, Seoul, 04620, Republic of Korea+82-2-2260-3114
Copyright(c) 2023 DONGGUK UNIVERSITY. ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.
