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부분 다중 샘플링 기법을 적용한 CMOS 이미지 센서 용 저 잡음 Single-Slope ADC
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김수연 | - |
| dc.contributor.author | 이호현 | - |
| dc.date.accessioned | 2026-03-07T04:30:13Z | - |
| dc.date.available | 2026-03-07T04:30:13Z | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/63906 | - |
| dc.title | 부분 다중 샘플링 기법을 적용한 CMOS 이미지 센서 용 저 잡음 Single-Slope ADC | - |
| dc.title.alternative | Low noise single-slope adc using partial multiple sampling technique for CMOS image sensor | - |
| dc.type | Patent | - |
| dc.publisher.location | 대한민국 | - |
| dc.contributor.assignee | 동국대학교산학협력단 | - |
| dc.date.application | 2024-03-15 | - |
| dc.date.registration | 2026-01-21 | - |
| dc.type.iprs | 특허 | - |
| dc.identifier.patentRegistrationNumber | 10-2917602 | - |
| dc.identifier.patentApplicationNumber | 10-2024-0036480 | - |
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Related Researcher
- Kim, Soo Youn
- College of Advanced Convergence Engineering (Division of System Semiconductor)