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표면 근전도의 잡음으로부터 발화를 측정하는 방법
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박성식 | - |
| dc.contributor.author | 이준석 | - |
| dc.date.accessioned | 2025-12-20T04:30:27Z | - |
| dc.date.available | 2025-12-20T04:30:27Z | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/62470 | - |
| dc.title | 표면 근전도의 잡음으로부터 발화를 측정하는 방법 | - |
| dc.title.alternative | Method to measure onset of sEMG from baseline noise | - |
| dc.type | Patent | - |
| dc.publisher.location | 대한민국 | - |
| dc.contributor.assignee | 동국대학교산학협력단 | - |
| dc.date.application | 2022-01-26 | - |
| dc.date.registration | 2025-11-21 | - |
| dc.type.iprs | 특허 | - |
| dc.identifier.patentRegistrationNumber | 10-2891607 | - |
| dc.identifier.patentApplicationNumber | 10-2022-0011467 | - |
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