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DRAM 고용량 커패시터 하부전극 제조방법

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dc.contributor.author김삼동-
dc.date.accessioned2025-09-09T07:35:13Z-
dc.date.available2025-09-09T07:35:13Z-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/60011-
dc.description.abstract본 발명은 티타늄 (Ti) 자기정렬 (Self-alignment) 방식을 통하여 제조된 티타늄 실리사이드 (TiSi2) 나노구조를 DRAM 커패시터의 하부전극으로 사용하여 고용량 커패시턴스를 구현하는 제조방법에 관한 것이다.-
dc.titleDRAM 고용량 커패시터 하부전극 제조방법-
dc.title.alternativeSelf-aligned stroage node electrode for DRAM cell and fabricating method thereof-
dc.typePatent-
dc.publisher.location대한민국-
dc.contributor.assignee동국대학교산학협력단-
dc.date.application2016-12-29-
dc.date.registration2018-09-18-
dc.type.iprs특허-
dc.identifier.patentRegistrationNumber10-1901900-
dc.identifier.patentApplicationNumber10-2016-0182763-
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