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내재적연관성테스트 사용 스트레스 유발 요인 진단 프로세스
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 여준상 | - |
| dc.contributor.author | 복상용 | - |
| dc.contributor.author | 정언용 | - |
| dc.date.accessioned | 2025-09-09T07:33:54Z | - |
| dc.date.available | 2025-09-09T07:33:54Z | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/59943 | - |
| dc.title | 내재적연관성테스트 사용 스트레스 유발 요인 진단 프로세스 | - |
| dc.title.alternative | Diagnostic process of factors inducing stress using IAT | - |
| dc.type | Patent | - |
| dc.publisher.location | 대한민국 | - |
| dc.contributor.assignee | 동국대학교산학협력단 | - |
| dc.date.application | 2016-05-12 | - |
| dc.date.registration | 2017-07-06 | - |
| dc.type.iprs | 특허 | - |
| dc.identifier.patentRegistrationNumber | 10-1757398 | - |
| dc.identifier.patentApplicationNumber | 10-2016-0058377 | - |
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Collections - Dongguk Business School > Department of Business Administration > 4. Patents
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Related Researcher
- Yeo, Jun Sang
- Dongguk Business School (Department of Business Administration)