Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

[US]전계 발광 시료 분석 장치

Full metadata record
DC Field Value Language
dc.contributor.author조훈영-
dc.contributor.author곽동욱-
dc.contributor.author이동화-
dc.contributor.author최현열-
dc.date.accessioned2025-09-09T06:36:25Z-
dc.date.available2025-09-09T06:36:25Z-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/59508-
dc.title[US]전계 발광 시료 분석 장치-
dc.title.alternativeAPPARATUS FOR INSPECTION OF ELECTROLUMINESCENCE SAMPLE-
dc.typePatent-
dc.publisher.location미국-
dc.contributor.assignee동국대학교산학협력단-
dc.date.application2012-10-25-
dc.date.registration2015-01-13-
dc.type.iprs특허-
dc.identifier.patentRegistrationNumber8,934,089-
dc.identifier.patentApplicationNumber13/660,765-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Natural Science > Department of Physics > 4. Patents

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetrics

Total Views & Downloads

BROWSE