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[JP]전계 발광 시료 분석 장치
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조훈영 | - |
| dc.contributor.author | 곽동욱 | - |
| dc.contributor.author | 이동화 | - |
| dc.contributor.author | 최현열 | - |
| dc.date.accessioned | 2025-09-09T06:34:21Z | - |
| dc.date.available | 2025-09-09T06:34:21Z | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/59398 | - |
| dc.title | [JP]전계 발광 시료 분석 장치 | - |
| dc.title.alternative | APPARATUS FOR INSPECTION OF ELECTROLUMINESCENCE SAMPLE | - |
| dc.type | Patent | - |
| dc.publisher.location | 일본 | - |
| dc.contributor.assignee | 동국대학교산학협력단 | - |
| dc.date.application | 2012-10-23 | - |
| dc.date.registration | 2013-12-13 | - |
| dc.type.iprs | 특허 | - |
| dc.identifier.patentRegistrationNumber | 5432416 | - |
| dc.identifier.patentApplicationNumber | 2013-506064 | - |
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Collections - College of Natural Science > Department of Physics > 4. Patents
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