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전계 발광 시료 분석 장치

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dc.contributor.author조훈영-
dc.contributor.author곽동욱-
dc.contributor.author이동화-
dc.contributor.author최현열-
dc.date.accessioned2025-09-09T06:32:18Z-
dc.date.available2025-09-09T06:32:18Z-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/59269-
dc.title전계 발광 시료 분석 장치-
dc.title.alternativeAPPARATUS FOR INSPECTION OF ELECTROLUMINESCENCE SAMPLE-
dc.typePatent-
dc.publisher.location대한민국-
dc.contributor.assignee동국대학교산학협력단-
dc.date.application2010-05-06-
dc.date.registration2011-12-14-
dc.type.iprs특허-
dc.identifier.patentRegistrationNumber10-1096629-00-00-
dc.identifier.patentApplicationNumber10-2010-0042633-
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College of Natural Science > Department of Physics > 4. Patents

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