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Electrical Characterization of PEALD-IGZO Thin-Film Transistors
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김현석 | - |
| dc.date.accessioned | 2025-01-18T00:31:16Z | - |
| dc.date.available | 2025-01-18T00:31:16Z | - |
| dc.date.issued | 2024-03-27 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/57368 | - |
| dc.title | Electrical Characterization of PEALD-IGZO Thin-Film Transistors | - |
| dc.type | Conference | - |
| dc.citation.startPage | 6 | - |
| dc.citation.endPage | 6 | - |
| dc.citation.conferenceName | ITC 2024 | - |
| dc.citation.conferencePlace | 대한민국 | - |
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Related Researcher
- Kim, Hyun Suk
- College of Engineering (Department of Energy and Materials Engineering)