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Highly Stable Rad-Hard Metal Oxide Thin-Film Transistors for X-ray Image Sensing Applications
- Authors
- 김재현
- Issue Date
- 6-Aug-2024
- Place
- 대한민국
- Conference Name
- The 30th International Conference on Amorphous and Nanocrystalline Semiconductors
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Related Researcher
- Kim, Jae Hyun
- College of Advanced Convergence Engineering (Division of System Semiconductor)