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다중 광원을 이용한 고반사성 표면 결함 검출
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조성인 | - |
| dc.date.accessioned | 2025-01-18T00:01:56Z | - |
| dc.date.available | 2025-01-18T00:01:56Z | - |
| dc.date.issued | 2024-10-17 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/57197 | - |
| dc.title | 다중 광원을 이용한 고반사성 표면 결함 검출 | - |
| dc.type | Conference | - |
| dc.citation.startPage | 33 | - |
| dc.citation.endPage | 36 | - |
| dc.citation.conferenceName | 인공지능신호처리 학술대회 | - |
| dc.citation.conferencePlace | 대한민국 | - |
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