On Using nMOS-pMOS-Type Cells in a Threshold-Voltage Compensated CMOS RF-DC Rectifier
- Authors
- Park, Yoomi; Byun, Sangjin
- Issue Date
- May-2025
- Publisher
- IEEE
- Keywords
- Rectifiers; Wire; Threshold voltage; Artificial neural networks; Transistors; Radio frequency; Sensitivity; MOSFET; Logic gates; Junctions; CMOS integrated circuits; RF-dc rectifier; RF energy harvester (RFEH); threshold voltage compensation
- Citation
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems, v.33, no.5, pp 1472 - 1476
- Pages
- 5
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- Volume
- 33
- Number
- 5
- Start Page
- 1472
- End Page
- 1476
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/56623
- DOI
- 10.1109/TVLSI.2024.3515110
- ISSN
- 1063-8210
1557-9999
- Abstract
- In this brief, we discuss the merits of using nMOS-pMOS (NP)-type cells instead of nMOS-nMOS (NN)-or pMOS-pMOS (PP)-type cells in a single-ended, threshold-voltage compensated CMOS RF-dc rectifier. By adopting the NP-type cells, we can avoid the degradation of the generated output dc voltage due to parasitic long interconnection wire capacitance, deep N-well to P-substrate junction capacitance, and additional body effect. For comparison, we have implemented two RF-dc rectifiers in a 28-nm 1P11M CMOS process. The measured results show that the implemented RF-dc rectifier with the NP-type cells achieves 0.7-dB higher input power sensitivity and 3 x faster recharging time than the other rectifier with the NN-type cells.
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- Appears in
Collections - College of Engineering > Department of Electronics and Electrical Engineering > 1. Journal Articles

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