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A highly effective and reliable GRU using a denoising deep learning scheme for improving SOC estimation accuracy
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 전준현 | - |
| dc.date.accessioned | 2024-10-31T01:21:17Z | - |
| dc.date.available | 2024-10-31T01:21:17Z | - |
| dc.date.issued | 2023-10-10 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/55774 | - |
| dc.title | A highly effective and reliable GRU using a denoising deep learning scheme for improving SOC estimation accuracy | - |
| dc.type | Conference | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 1 | - |
| dc.citation.conferenceName | Batteries Event 2023 | - |
| dc.citation.conferencePlace | 프랑스 | - |
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Related Researcher
- Jeon, Joon Hyeon
- College of Engineering (Department of Electronics and Electrical Engineering)