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Fabrication and Characterization of Synaptic Devices Based on Au/HfxZr1-xO2/Pt Ferroelectric Tunnel Junction

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dc.contributor.author이세준-
dc.date.accessioned2024-10-31T01:20:22Z-
dc.date.available2024-10-31T01:20:22Z-
dc.date.issued2023-01-10-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/55517-
dc.titleFabrication and Characterization of Synaptic Devices Based on Au/HfxZr1-xO2/Pt Ferroelectric Tunnel Junction-
dc.typeConference-
dc.citation.startPage0-
dc.citation.endPage0-
dc.citation.conferenceName7th International Conference on Advances in Functional Materials-
dc.citation.conferencePlace일본-
dc.citation.conferencePlaceKyushu University-
dc.citation.conferenceDate2023-01-09 ~ 2023-01-12-
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