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Determination of traps density in Deep level on ELA Polycrystalline Si
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조훈영 | - |
| dc.date.accessioned | 2024-10-30T12:03:15Z | - |
| dc.date.available | 2024-10-30T12:03:15Z | - |
| dc.date.issued | 2012-04-25 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/47210 | - |
| dc.title | Determination of traps density in Deep level on ELA Polycrystalline Si | - |
| dc.type | Conference | - |
| dc.citation.startPage | 112 | - |
| dc.citation.endPage | 112 | - |
| dc.citation.conferenceName | 한국물리학회 2012 봄 학술발표회 | - |
| dc.citation.conferencePlace | 대한민국 | - |
| dc.citation.conferencePlace | 대전컨벤션센터 | - |
| dc.citation.conferenceDate | 2012-04-24 ~ 2012-12-27 | - |
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