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Electrical properties of doped-ZnO nanorods by Kelvin probe force microscopy
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 양우철 | - |
| dc.date.accessioned | 2024-10-30T10:02:43Z | - |
| dc.date.available | 2024-10-30T10:02:43Z | - |
| dc.date.issued | 2011-05-26 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/45340 | - |
| dc.title | Electrical properties of doped-ZnO nanorods by Kelvin probe force microscopy | - |
| dc.type | Conference | - |
| dc.citation.startPage | 420 | - |
| dc.citation.endPage | 423 | - |
| dc.citation.conferenceName | 8th international symposium on atomic level characterizations | - |
| dc.citation.conferencePlace | 일본 | - |
| dc.citation.conferencePlace | 올림픽파크 | - |
| dc.citation.conferenceDate | 2011-05-22 ~ 2011-05-27 | - |
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Related Researcher
- Yang, Woo Chul
- College of Natural Science (Department of Physics)