Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Evolution of Deep-Level Defects on Polycrystalline Silicon Using Photoinduced Current Transient Spectroscopy
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조훈영 | - |
| dc.date.accessioned | 2024-10-30T10:02:36Z | - |
| dc.date.available | 2024-10-30T10:02:36Z | - |
| dc.date.issued | 2011-10-21 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/45304 | - |
| dc.title | Evolution of Deep-Level Defects on Polycrystalline Silicon Using Photoinduced Current Transient Spectroscopy | - |
| dc.type | Conference | - |
| dc.citation.startPage | 79 | - |
| dc.citation.endPage | 79 | - |
| dc.citation.conferenceName | 한국물리학회 | - |
| dc.citation.conferencePlace | 대한민국 | - |
| dc.citation.conferenceDate | 2011-10-19 ~ 2011-10-21 | - |
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Natural Science > Department of Physics > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.