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Manipulation and electronic characterization of semiconductor nanostructures by Scanning Probe microscopy
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 강태원 | - |
| dc.date.accessioned | 2024-10-30T10:02:35Z | - |
| dc.date.available | 2024-10-30T10:02:35Z | - |
| dc.date.issued | 2011-11-28 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/45297 | - |
| dc.title | Manipulation and electronic characterization of semiconductor nanostructures by Scanning Probe microscopy | - |
| dc.type | Conference | - |
| dc.citation.startPage | 0 | - |
| dc.citation.endPage | 0 | - |
| dc.citation.conferenceName | The 10th 2011 Korea-Uzbekistan Joint International Symposium on Quantum Functional Materials and Devices | - |
| dc.citation.conferencePlace | 대한민국 | - |
| dc.citation.conferenceDate | 2011-11-28 ~ 2011-11-29 | - |
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