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Defect States in ELA poly-Si films by Photoinduced Current Transient Spectroscopy
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조훈영 | - |
| dc.date.accessioned | 2024-10-30T06:22:26Z | - |
| dc.date.available | 2024-10-30T06:22:26Z | - |
| dc.date.issued | 2009-12-10 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/42179 | - |
| dc.title | Defect States in ELA poly-Si films by Photoinduced Current Transient Spectroscopy | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | International Conference on Advanced Materials and Devices | - |
| dc.citation.conferencePlace | 대한민국 | - |
| dc.citation.conferencePlace | 라마다호텔 | - |
| dc.citation.conferenceDate | 2009-12-09 ~ 2009-12-11 | - |
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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