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Charge re-trapping process in Oxide-Nitride-Al2O3(ONA) structure
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조훈영 | - |
| dc.date.accessioned | 2024-10-30T06:02:46Z | - |
| dc.date.available | 2024-10-30T06:02:46Z | - |
| dc.date.issued | 2008-10-14 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/41952 | - |
| dc.title | Charge re-trapping process in Oxide-Nitride-Al2O3(ONA) structure | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | Electro Chemical Society | - |
| dc.citation.conferencePlace | 미국 | - |
| dc.citation.conferencePlace | Hilton Hawaii | - |
| dc.citation.conferenceDate | 2008-10-12 ~ 2008-10-17 | - |
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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