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Patent Analysis for Technology Forecasting: Sector-specific Application
- Authors
- 윤병운
- Issue Date
- 28-Jun-2008
- Place
- 대한민국
Estoril, Portugal
- Conference Date
- 2008-06-28 ~ 2008-06-30
- Conference Name
- IEMC -Europe 2008
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Related Researcher
- Yoon, Byung Un
- College of Engineering (Department of Industrial and Systems Engineering)