Cited 0 time in
electrical properties and controlled growth of Ge-nanocrystals embbedd in a SiO2 matrix using electron beam irraidation
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 양우철 | - |
| dc.date.accessioned | 2024-10-30T05:21:57Z | - |
| dc.date.available | 2024-10-30T05:21:57Z | - |
| dc.date.issued | 2008-03-14 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/41168 | - |
| dc.title | electrical properties and controlled growth of Ge-nanocrystals embbedd in a SiO2 matrix using electron beam irraidation | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 제 3회 전자빔 이용기술 워크샵 | - |
| dc.citation.conferencePlace | 대한민국 | - |
| dc.citation.conferencePlace | 대전 | - |
| dc.citation.conferenceDate | 2008-03-14 | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
30, Pildong-ro 1-gil, Jung-gu, Seoul, 04620, Republic of Korea+82-2-2260-3114
Copyright(c) 2023 DONGGUK UNIVERSITY. ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.
