Photo-depopulation processes of charge traps in CTF non-volatile memory
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| DC Field |
Value |
Language |
| dc.contributor.author | 조훈영 | - |
| dc.date.accessioned | 2024-10-30T05:21:56Z | - |
| dc.date.available | 2024-10-30T05:21:56Z | - |
| dc.date.issued | 2008-06-22 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/41161 | - |
| dc.title | Photo-depopulation processes of charge traps in CTF non-volatile memory | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | Workshop on Dielectrics in Microelectronics | - |
| dc.citation.conferencePlace | 독일 | - |
| dc.citation.conferencePlace | in Bad Saarow (Berlin), Germany | - |
| dc.citation.conferenceDate | 2008-06-22 ~ 2008-06-26 | - |
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